Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12146840 | Defect inspection device | Eiji Arima, Shunichi Matsumoto | 2024-11-19 |
| 12044627 | Defect inspection device and defect inspection method | Masaya Yamamoto, Masami Makuuchi, Nobuhiro Obara, Shunichi Matsumoto | 2024-07-23 |
| 12025569 | Defect inspection device and inspection method, and optical module | Shunichi Matsumoto, Eiji Arima, Yuta Urano | 2024-07-02 |