Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12044627 | Defect inspection device and defect inspection method | Masaya Yamamoto, Toshifumi Honda, Masami Makuuchi, Shunichi Matsumoto | 2024-07-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12044627 | Defect inspection device and defect inspection method | Masaya Yamamoto, Toshifumi Honda, Masami Makuuchi, Shunichi Matsumoto | 2024-07-23 |