VT

Vandan Tanna

GC Globalwafers Co.: 2 patents #26 of 99Top 30%
📍 O'Fallon, MO: #9 of 52 inventorsTop 20%
🗺 Missouri: #283 of 2,318 inventorsTop 15%
Overall (2024): #106,811 of 561,600Top 20%
2
Patents 2024

Issued Patents 2024

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12019031 Cleaved semiconductor wafer imaging system Benjamin Michael Meyer, Justin Scott Kayser, John F. Valley, James Dean Eoff, William L. Luter 2024-06-25
11921054 Cleaved semiconductor wafer camera system Benjamin Michael Meyer, Justin Scott Kayser, John F. Valley, James Dean Eoff, William L. Luter 2024-03-05