Issued Patents 2024
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175650 | Processing image data sets | Jens Timo Neumann, Abhilash Srikantha, Christian Wojek | 2024-12-24 |
| 12148139 | Methods and evaluation devices for analyzing three-dimensional data sets representing devices | Ramani Pichumani, Dmitry Klochkov, Jens Timo Neumann | 2024-11-19 |
| 12056865 | Wafer-tilt determination for slice-and-image process | Dmitry Klochkov, Chuong Huynh | 2024-08-06 |
| 12045969 | Automated root cause analysis for defect detection during fabrication processes of semiconductor structures | Jens Timo Neumann, Eugen Foca, Ramani Pichumani, Abhilash Srikantha, Christian Wojek +1 more | 2024-07-23 |
| 11915908 | Method for measuring a sample and microscope implementing the method | Eugen Foca, Amir Avishai, Dmitry Klochkov, Jens Timo Neumann, Keumsil Lee | 2024-02-27 |