Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12045969 | Automated root cause analysis for defect detection during fabrication processes of semiconductor structures | Jens Timo Neumann, Ramani Pichumani, Abhilash Srikantha, Christian Wojek, Thomas Korb +1 more | 2024-07-23 |
| 11915908 | Method for measuring a sample and microscope implementing the method | Amir Avishai, Dmitry Klochkov, Thomas Korb, Jens Timo Neumann, Keumsil Lee | 2024-02-27 |