Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12148139 | Methods and evaluation devices for analyzing three-dimensional data sets representing devices | Ramani Pichumani, Thomas Korb, Jens Timo Neumann | 2024-11-19 |
| 12056865 | Wafer-tilt determination for slice-and-image process | Chuong Huynh, Thomas Korb | 2024-08-06 |
| 11915908 | Method for measuring a sample and microscope implementing the method | Eugen Foca, Amir Avishai, Thomas Korb, Jens Timo Neumann, Keumsil Lee | 2024-02-27 |