Issued Patents 2024
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12055904 | Method to predict yield of a device manufacturing process | Boris Menchtchikov, Cyrus E. Tabery, Yi Zou, Chenxi Lin, Yana Cheng +2 more | 2024-08-06 |
| 12044980 | Method of manufacturing devices | Abraham SLACHTER, Wim Tjibbo Tel, Daan Maurits Slotboom, Vadim Yourievich TIMOSHKOV, Koen Wilhelmus Cornelis Adrianus Van Der Straten +7 more | 2024-07-23 |
| 12038694 | Determining pattern ranking based on measurement feedback from printed substrate | Maxime Philippe Frederic Genin, Cong Wu, Jing Su, Weixuan HU, Yi Zou | 2024-07-16 |
| 11966166 | Measurement apparatus and a method for determining a substrate grid | Franciscus Godefridus Casper Bijnen, Edo Maria Hulsebos, Henricus Johannes Lambertus Megens, Robert John Socha | 2024-04-23 |
| 11947266 | Method for controlling a manufacturing process and associated apparatuses | Nicolaas Petrus Marcus Brantjes, Matthijs Cox, Boris Menchtchikov, Cyrus E. Tabery, Yi Zou +4 more | 2024-04-02 |