Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165831 | Method and system of image-forming multi-electron beams | Xinrong Jiang, Christopher Sears, Sameet K. Shriyan, Jeong Ho Lee, Michael Steigerwald +1 more | 2024-12-10 |
| 12165837 | System and method for scanning a sample using multi-beam inspection apparatus | Martinus Gerardus Johannes Maria MAASSEN, Joost Jeroen Ottens, Long Ma, Weihua Yin, Wei Li +1 more | 2024-12-10 |
| 12068129 | Tilt-column multi-beam electron microscopy system and method | Xinrong Jiang, Ralph Nyffenegger, Michael Steigerwald | 2024-08-20 |