Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165837 | System and method for scanning a sample using multi-beam inspection apparatus | Martinus Gerardus Johannes Maria MAASSEN, Joost Jeroen Ottens, Long Ma, Youfei Jiang, Wei Li +1 more | 2024-12-10 |