Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12092963 | Method of determining characteristic of patterning process based on defect for reducing hotspot | Duan-Fu Stephen Hsu, Rafael C. Howell, Qinglin Li | 2024-09-17 |
| 11899374 | Method for determining an electromagnetic field associated with a computational lithography mask model | Jingjing Liu | 2024-02-13 |