Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12092963 | Method of determining characteristic of patterning process based on defect for reducing hotspot | Xingyue PENG, Duan-Fu Stephen Hsu, Rafael C. Howell | 2024-09-17 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12092963 | Method of determining characteristic of patterning process based on defect for reducing hotspot | Xingyue PENG, Duan-Fu Stephen Hsu, Rafael C. Howell | 2024-09-17 |