Issued Patents 2024
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12169366 | Voltage contrast metrology mark | Cyrus E. Tabery, Simon Hendrik Celine Van Gorp, Brennan Peterson | 2024-12-17 |
| 12055904 | Method to predict yield of a device manufacturing process | Youping Zhang, Boris Menchtchikov, Cyrus E. Tabery, Yi Zou, Chenxi Lin +2 more | 2024-08-06 |
| 12044980 | Method of manufacturing devices | Abraham SLACHTER, Wim Tjibbo Tel, Daan Maurits Slotboom, Vadim Yourievich TIMOSHKOV, Koen Wilhelmus Cornelis Adrianus Van Der Straten +7 more | 2024-07-23 |
| 11947266 | Method for controlling a manufacturing process and associated apparatuses | Nicolaas Petrus Marcus Brantjes, Matthijs Cox, Boris Menchtchikov, Cyrus E. Tabery, Youping Zhang +4 more | 2024-04-02 |