Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11719719 | Metrology probe with built-in angle and method of fabrication thereof | Jeffrey Wong, Joseph S. Fragala, Weijie Wang, Xing Zhao, Rakesh Poddar | 2023-08-08 |
| 11644480 | Thermally stable, drift resistant probe for a scanning probe microscope and method of manufacture | Jeffrey Wong | 2023-05-09 |