Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11719719 | Metrology probe with built-in angle and method of fabrication thereof | Jeffrey Wong, Weijie Wang, Deepkishore Mukhopadhyay, Xing Zhao, Rakesh Poddar | 2023-08-08 |
| 11694867 | Silicon nitride x-ray window and method of manufacture for x-ray detector use | Xing Zhao | 2023-07-04 |