Issued Patents 2023
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852683 | Scan chain self-testing of lockstep cores on reset | Prakash Narayanan | 2023-12-26 |
| 11776656 | System and method for parallel memory test | Nitesh Mishra | 2023-10-03 |
| 11715544 | System and method for low power memory test | Nitesh Mishra | 2023-08-01 |
| 11680984 | Control data registers for scan testing | Wilson Pradeep, Aravinda Acharya | 2023-06-20 |
| 11555853 | Scan chain self-testing of lockstep cores on reset | Prakash Narayanan | 2023-01-17 |