Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852683 | Scan chain self-testing of lockstep cores on reset | Nikita Naresh | 2023-12-26 |
| 11821945 | Full pad coverage boundary scan | Rajesh Mittal, Rajat Mehrotra | 2023-11-21 |
| 11768726 | Delay fault testing of pseudo static controls | Aravinda Acharya, Wilson Pradeep | 2023-09-26 |
| 11709203 | Transition fault testing of functionally asynchronous paths in an integrated circuit | Sundarrajan Rangachari, Prashanth Saraf | 2023-07-25 |
| 11592483 | Compressed scan chain diagnosis by internal chain observation, processes, circuits, devices and systems | Rubin Ajit Parekhji, Arvind Jain, Sundarrajan Subramanian | 2023-02-28 |
| 11555853 | Scan chain self-testing of lockstep cores on reset | Nikita Naresh | 2023-01-17 |