Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11734142 | Scan synchronous-write-through testing architectures for a memory device | Ming-Hung Chang, Atul Katoch, Chia-En Huang, Ching-Wei Wu, Donald George Mikan, Jr. +5 more | 2023-08-22 |