Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11734142 | Scan synchronous-write-through testing architectures for a memory device | Atul Katoch, Chia-En Huang, Ching-Wei Wu, Donald George Mikan, Jr., Hao-I Yang +5 more | 2023-08-22 |
| 11543455 | Circuit measuring device and method | Chuang XU, Wen-Yen Chen | 2023-01-03 |