Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11837435 | Atom probe tomography specimen preparation | Shih-Wei Hung | 2023-12-05 |
| 11774241 | Line edge roughness analysis using atomic force microscopy | Wei-Shan Hu, Dong Gui, Che-Liang Li, Duen-Huei Hou, Wen-Chung Liu | 2023-10-03 |
| 11703523 | Method and apparatus for detecting ferroelectric signal | Wei-Shan Hu, Dong Gui | 2023-07-18 |