Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11774241 | Line edge roughness analysis using atomic force microscopy | Wei-Shan Hu, Dong Gui, Jang Jung Lee, Duen-Huei Hou, Wen-Chung Liu | 2023-10-03 |
CL
Che-Liang Li
Overall (2023): #488,182 of 537,848Top 95%
1
Patents 2023