Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815493 | Defect inspection apparatus and defect inspection method | Takahide HATAHORI, Koki YOSHIDA | 2023-11-14 |
| 11790513 | Defect inspection apparatus and defect inspection method | Koki YOSHIDA, Takahide HATAHORI | 2023-10-17 |
| 11774746 | Interference image imaging apparatus | Takahide HATAHORI, Koki YOSHIDA | 2023-10-03 |