Issued Patents 2023
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815493 | Defect inspection apparatus and defect inspection method | Takahide HATAHORI, Kenji Takubo | 2023-11-14 |
| 11790513 | Defect inspection apparatus and defect inspection method | Takahide HATAHORI, Kenji Takubo | 2023-10-17 |
| 11774746 | Interference image imaging apparatus | Takahide HATAHORI, Kenji Takubo | 2023-10-03 |
| 11717245 | X-ray fluoroscopic imaging apparatus | Fumiaki Tanaka, Ryusuke Watanabe | 2023-08-08 |
| 11642091 | X-ray fluoroscopic imaging apparatus | Dai Hirose | 2023-05-09 |