Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11694319 | Image-based defects identification and semi-supervised localization | Janghwan Lee, Shuhui Qu, Jinghua Yao, Sai MarapaReddy | 2023-07-04 |
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Yan Kang
Overall (2023): #200,394 of 537,848Top 40%
1
Patents 2023