Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11694319 | Image-based defects identification and semi-supervised localization | Yan Kang, Janghwan Lee, Jinghua Yao, Sai MarapaReddy | 2023-07-04 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11694319 | Image-based defects identification and semi-supervised localization | Yan Kang, Janghwan Lee, Jinghua Yao, Sai MarapaReddy | 2023-07-04 |