Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11688623 | Wafer inspection apparatuses | Racine Elysia Auxter Nassau, Namil Koo, Taeheung Ahn, Sangyeon OH | 2023-06-27 |
| 11579167 | Probe for detecting near field and near-field detection system including the same | Jongmin YOON, Namil Koo, Nagel Michael, Junbum Park, Inkeun Baek +1 more | 2023-02-14 |