Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11680898 | Hybrid probe, physical property analysis apparatus including the same, and method of measuring semiconductor device using the apparatus | Junbum Park, Namil Koo, Jongmin YOON | 2023-06-20 |
| 11579167 | Probe for detecting near field and near-field detection system including the same | Jongmin YOON, Namil Koo, Nagel Michael, Suhwan Park, Junbum Park +1 more | 2023-02-14 |
| 11579168 | Probe for detecting near field and near-field detecting system including the same | Ikseon Jeon, Namil Koo, Junbum Park | 2023-02-14 |