Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11579096 | Wafer inspection apparatus and method | Sungha Kim, Hyounggon Kim, Doohyun Cho, Kwangsung Lee, Jongsu Kim +1 more | 2023-02-14 |
JH
Jeongsu Ha
Overall (2023): #402,632 of 537,848Top 75%
1
Patents 2023