Issued Patents 2023
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11822548 | Data warehouse framework for high performance reporting | Jijiang Xu, Hendrik Cazemier, Ralf Vierich | 2023-11-21 |
| 11763446 | Wafer bin map based root cause analysis | Tomonori Honda, Lin Lee Cheong, Richard Burch, Jeffrey Drue David, Michael Keleher | 2023-09-19 |
| 11640160 | Pattern-enhanced spatial correlation of test structures to die level responses | Richard Burch | 2023-05-02 |
| 11609812 | Anomalous equipment trace detection and classification | Richard Burch, Jeffrey Drue David, Tomonori Honda, Lin Lee Cheong | 2023-03-21 |