Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11619649 | Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same | Sang-Il Park, Byoung-Woon Ahn, Seung Ho HAN | 2023-04-04 |