Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11619649 | Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same | Sang-Il Park, Seung Ho HAN, Sang J. Cho | 2023-04-04 |
| 11598788 | Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source | Sang-Il Park, Ahjin JO, Soobong Choi | 2023-03-07 |