Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11733032 | Measurement device and measurement method | Ken HATSUDA, Shota TEZUKA, Miyu UEDA, Takuya YASUNAGA | 2023-08-22 |
| 11604097 | Calibration method and calibration system | Kippei Sugita, Hana Sasaki, Kaoru Inaba, Mitsuru Dohiwa, Takashi Niinuma | 2023-03-14 |