Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11830174 | Defect inspecting device, defect inspecting method, and storage medium | Masashi Kurita | 2023-11-28 |
| 11769248 | Image processing device, image processing method, and image processing non-transitory computer readable medium for verifying detectable range of defect image | Masashi Kurita, Sakon Yamamoto | 2023-09-26 |
| 11574397 | Image processing device, image processing method, and computer readable recording medium | Masashi Kurita | 2023-02-07 |