MK

Masashi Kurita

OM Omron: 4 patents #23 of 366Top 7%
Overall (2023): #43,269 of 537,848Top 9%
4
Patents 2023

Issued Patents 2023

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
11830174 Defect inspecting device, defect inspecting method, and storage medium Yasuyuki Ikeda 2023-11-28
11769248 Image processing device, image processing method, and image processing non-transitory computer readable medium for verifying detectable range of defect image Yasuyuki Ikeda, Sakon Yamamoto 2023-09-26
11631230 Method, device, system and computer-program product for setting lighting condition and storage medium Yosuke Naruse 2023-04-18
11574397 Image processing device, image processing method, and computer readable recording medium Yasuyuki Ikeda 2023-02-07