Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11710616 | TEM-based metrology method and system | Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2023-07-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11710616 | TEM-based metrology method and system | Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2023-07-25 |