Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11763181 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2023-09-19 |
| 11710616 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2023-07-25 |