Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11644481 | Atomic force microscopy cantilever, system and method | Hamed Sadeghian Marnani | 2023-05-09 |
| 11635448 | Heterodyne scanning probe microscopy method and scanning probe microscopy system | Sri Ram Shankar Rajadurai, Daniele Piras, Kodai HATAKEYAMA, Paul Louis Maria Joseph VAN NEER, Hamed Sadeghian Marnani +1 more | 2023-04-25 |