Issued Patents 2023
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11774381 | Method for measuring damage of a substrate caused by an electron beam | — | 2023-10-03 |
| 11650224 | Method of positioning a carrier on a flat surface, and assembly of a carrier and a positioning member | Jasper Winters, William Edward Crowcombe, Teunis Cornelis van den Dool, Geerten Frans Ijsbrand Kramer, Albert Dekker | 2023-05-16 |
| 11644481 | Atomic force microscopy cantilever, system and method | Maarten Hubertus van Es | 2023-05-09 |
| 11635448 | Heterodyne scanning probe microscopy method and scanning probe microscopy system | Sri Ram Shankar Rajadurai, Daniele Piras, Kodai HATAKEYAMA, Paul Louis Maria Joseph VAN NEER, Maarten Hubertus van Es +1 more | 2023-04-25 |
| 11592460 | Scanning probe microscope, scan head and method | Roelof Willem Herfst | 2023-02-28 |