VP

Vadim Pinskiy

NI Nanotronics Imaging: 11 patents #3 of 27Top 15%
📍 Wayne, NJ: #1 of 50 inventorsTop 2%
🗺 New Jersey: #83 of 6,594 inventorsTop 2%
Overall (2023): #6,210 of 537,848Top 2%
11
Patents 2023

Issued Patents 2023

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
11796785 Systems, devices and methods for automatic microscope focus John B. Putman, Matthew C. Putman, Denis Sharoukhov 2023-10-24
11748846 Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging Matthew C. Putman, John B. Putman, Joseph Succar 2023-09-05
11731368 Systems, methods, and media for artificial intelligence process control in additive manufacturing Matthew C. Putman, Damas Limoge, Aswin Raghav Nirmaleswaran 2023-08-22
11709483 Predictive process control for a manufacturing process Matthew C. Putman, John B. Putman, Damas Limoge 2023-07-25
11703824 Assembly error correction for assembly lines Matthew C. Putman, Eun-Sol Kim, Andrew Sundstrom 2023-07-18
11693956 Dynamic monitoring and securing of factory processes, equipment and automated systems Matthew C. Putman, John B. Putman, Damas Limoge, Andrew Sundstrom, James Williams, III 2023-07-04
11675330 System and method for improving assembly line processes Matthew C. Putman, Eun-Sol Kim, Andrew Sundstrom 2023-06-13
11669078 Predictive process control for a manufacturing process Matthew C. Putman, John B. Putman, Damas Limoge 2023-06-06
11663327 Method, systems and apparatus for intelligently emulating factory control systems and simulating response data Matthew C. Putman, John B. Putman, Andrew Sundstrom, James Williams, III 2023-05-30
11662563 Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel Matthew C. Putman, John B. Putman, Denis Sharoukhov 2023-05-30
11574413 Deep photometric learning (DPL) systems, apparatus and methods Matthew C. Putman, Tanaporn Na Narong, Denis Sharoukhov, Tonislav Ivanov 2023-02-07