MP

Matthew C. Putman

NI Nanotronics Imaging: 22 patents #1 of 27Top 4%
NL Nanotronics Health, Llc.: 1 patents #3 of 4Top 75%
📍 Brooklyn, NY: #2 of 1,100 inventorsTop 1%
🗺 New York: #30 of 11,993 inventorsTop 1%
Overall (2023): #1,461 of 537,848Top 1%
23
Patents 2023

Issued Patents 2023

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
11846765 Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating thereto John B. Putman, Julie Orlando, Jospeh G. Bulman 2023-12-19
11815673 Method and system for mapping objects on unknown specimens John B. Putman, John Cruickshank, Julie Orlando, Adele Frankel, Brandon Scott 2023-11-14
11796785 Systems, devices and methods for automatic microscope focus John B. Putman, Vadim Pinskiy, Denis Sharoukhov 2023-10-24
11784386 Fault protected signal splitter apparatus John B. Putman, Damas Limoge, Michael Moskie, Jonathan Lee 2023-10-10
11747911 Apparatus and method for manipulating objects with gesture controls John B. Putman, Paul Roossin 2023-09-05
11748846 Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging John B. Putman, Vadim Pinskiy, Joseph Succar 2023-09-05
11731368 Systems, methods, and media for artificial intelligence process control in additive manufacturing Vadim Pinskiy, Damas Limoge, Aswin Raghav Nirmaleswaran 2023-08-22
11709483 Predictive process control for a manufacturing process John B. Putman, Vadim Pinskiy, Damas Limoge 2023-07-25
11703824 Assembly error correction for assembly lines Vadim Pinskiy, Eun-Sol Kim, Andrew Sundstrom 2023-07-18
11693956 Dynamic monitoring and securing of factory processes, equipment and automated systems John B. Putman, Vadim Pinskiy, Damas Limoge, Andrew Sundstrom, James Williams, III 2023-07-04
11672933 Method and system for bi-level treatment of sleep apnea John B. Putman, Julie Orlando 2023-06-13
11675330 System and method for improving assembly line processes Vadim Pinskiy, Eun-Sol Kim, Andrew Sundstrom 2023-06-13
11669617 Method, systems and apparatus for intelligently emulating factory control systems and simulating response data John B. Putman, Jonathan Lee 2023-06-06
11669078 Predictive process control for a manufacturing process John B. Putman, Vadim Pinskiy, Damas Limoge 2023-06-06
11669058 Dynamic monitoring and securing of factory processes, equipment and automated systems John B. Putman, Jonathan Lee, Damas Limoge 2023-06-06
11662563 Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel John B. Putman, Vadim Pinskiy, Denis Sharoukhov 2023-05-30
11663703 System, method and apparatus for macroscopic inspection of reflective specimens John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more 2023-05-30
11663327 Method, systems and apparatus for intelligently emulating factory control systems and simulating response data John B. Putman, Vadim Pinskiy, Andrew Sundstrom, James Williams, III 2023-05-30
11656184 Macro inspection systems, apparatus and methods John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more 2023-05-23
11656429 Systems, devices, and methods for automatic microscopic focus John B. Putman, Julie Orlando, Dylan Fashbaugh 2023-05-23
11593919 System, method and apparatus for macroscopic inspection of reflective specimens Jonathan Lee, Damas Limoge, John B. Putman, Michael Moskie 2023-02-28
11574413 Deep photometric learning (DPL) systems, apparatus and methods Vadim Pinskiy, Tanaporn Na Narong, Denis Sharoukhov, Tonislav Ivanov 2023-02-07
11561383 Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating thereto John B. Putman, Julie Orlando, Jospeh G. Bulman 2023-01-24