Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11714051 | Metrology system configured to measure apertures of workpieces | Joseph Daniel Tobiason | 2023-08-01 |
| 11573498 | Fast high power pulsed light source system for high speed metrology imaging | Bjorn Erik Bertil Jansson | 2023-02-07 |