Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11774270 | Encoder | Norman Laman, Shu Hirata, Tatsuhiko Mukuta, Akihide Kimura | 2023-10-03 |
| 11714051 | Metrology system configured to measure apertures of workpieces | Paul Gerard Gladnick | 2023-08-01 |