Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11784077 | Wafer overlay marks, overlay measurement systems, and related methods | Denzil S. Frost, Richard T. Housley, David S. Pratt | 2023-10-10 |
| 11574842 | Methods for forming conductive vias, and associated devices and systems | David A. Kewley, Aaron Michael Lowe, Radhakrishna Kotti, David S. Pratt | 2023-02-07 |