Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11784077 | Wafer overlay marks, overlay measurement systems, and related methods | Richard T. Housley, David S. Pratt, Trupti D. Gawai | 2023-10-10 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11784077 | Wafer overlay marks, overlay measurement systems, and related methods | Richard T. Housley, David S. Pratt, Trupti D. Gawai | 2023-10-10 |