Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854639 | Test circuit in scribe region for memory failure analysis | Atsuko Otsuka, Takeshi Kaku | 2023-12-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854639 | Test circuit in scribe region for memory failure analysis | Atsuko Otsuka, Takeshi Kaku | 2023-12-26 |