Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854639 | Test circuit in scribe region for memory failure analysis | Takeshi Kaku, Soeparto Tandjoeng | 2023-12-26 |
AO
Atsuko Otsuka
Overall (2023): #511,535 of 537,848Top 100%
1
Patents 2023