Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11579171 | Probe card for characterizing processes of submicron semiconductor device fabrication | — | 2023-02-14 |
| 11579182 | Probe card for efficient screening of highly-scaled monolithic semiconductor devices | Daniel Brodoceanu, Zheng Sung Chio, Chao Kai Tung | 2023-02-14 |