Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11699017 | Die yield assessment based on pattern-failure rate simulation | John L. Sturtevant, Andrew Burbine, Christopher Heinz Clifford | 2023-07-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11699017 | Die yield assessment based on pattern-failure rate simulation | John L. Sturtevant, Andrew Burbine, Christopher Heinz Clifford | 2023-07-11 |