Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11699017 | Die yield assessment based on pattern-failure rate simulation | Young-Chang Kim, John L. Sturtevant, Andrew Burbine | 2023-07-11 |
| 11552940 | System and method for continuous authentication of user entity identity using context and behavior for real-time modeling and anomaly detection | Shahrokh Shahidzadeh, Nahal Shahidzadeh, Haitham Akkary, Seyedamir Karimikho | 2023-01-10 |