Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11644756 | 3D structure inspection or metrology using deep learning | Kris Bhaskar, Lena Nicolaides | 2023-05-09 |
| 11580375 | Accelerated training of a machine learning based model for semiconductor applications | Kris Bhaskar, Laurent Karsenti, Mohan Mahadevan, Jing Zhang, Brian Duffy +4 more | 2023-02-14 |