Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11769242 | Mode selection and defect detection training | Jing Zhang, Yujie Dong, Vishank Bhatia, Patrick McBride, Brian Duffy | 2023-09-26 |
| 11644756 | 3D structure inspection or metrology using deep learning | Scott A. Young, Lena Nicolaides | 2023-05-09 |
| 11580375 | Accelerated training of a machine learning based model for semiconductor applications | Laurent Karsenti, Scott A. Young, Mohan Mahadevan, Jing Zhang, Brian Duffy +4 more | 2023-02-14 |
| 11580398 | Diagnostic systems and methods for deep learning models configured for semiconductor applications | Jing Zhang, Ravi Chandra Donapati, Mark J. Roulo | 2023-02-14 |
| 11551348 | Learnable defect detection for semiconductor applications | Jing Zhang, Zhuoning Yuan, Yujie Dong | 2023-01-10 |